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US Patent Issued to Purdue Research Foundation on May 12 for "Adaptive information mining interferometry apparatuses and methods" (American, Chilean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,079, issued on May 12, was assigned to Purdue Research Foundation (West Lafayette, Ind.). "Adaptive information mining interferometry appara... और पढ़ें


US Patent Issued to Agency for Science, Technology and Research on May 12 for "Multi-color pulse-amplitude modulated handheld fluorescence imager" (Singaporean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,080, issued on May 12, was assigned to Agency for Science, Technology and Research (Singapore). "Multi-color pulse-amplitude modulated handh... और पढ़ें


US Patent Issued to In Diagnostics on May 12 for "Single-use clinical spectrophotometer" (California Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,081, issued on May 12, was assigned to In Diagnostics Inc. (Carlsbad, Calif.). "Single-use clinical spectrophotometer" was invented by Octav... और पढ़ें


US Patent Issued to THE UNIVERSITY OF KITAKYUSHU, TOYOKO KAGAKU on May 12 for "Optical detection chip and optical detection system" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,082, issued on May 12, was assigned to THE UNIVERSITY OF KITAKYUSHU (Kitakyushu, Japan) and TOYOKO KAGAKU Co. LTD. (Kawasaki, Japan). "Optic... और पढ़ें


US Patent Issued to Nokia Technologies on May 12 for "Apparatus for detecting defects in a display module" (Finnish Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,083, issued on May 12, was assigned to Nokia Technologies Oy (Espoo, Finland). "Apparatus for detecting defects in a display module" was inv... और पढ़ें


US Patent Issued to Tetra Laval Holdings & Finance on May 12 for "Package quality inspection station and a method for inspecting quality of a package" (Italian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,084, issued on May 12, was assigned to Tetra Laval Holdings & Finance S.A. (Pully, Switzerland). "Package quality inspection station and a m... और पढ़ें


US Patent Issued to DMG MORI ADDITIVE on May 12 for "Analysis device for condition monitoring of a protective glass of a manufacturing facility and a manufacturing facility for an additive manufacturing process" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,085, issued on May 12, was assigned to DMG MORI ADDITIVE GMBH (Bielefeld, Germany). "Analysis device for condition monitoring of a protectiv... और पढ़ें


US Patent Issued to EMvision Medical Devices on May 12 for "Apparatus and process for medical imaging" (Australian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,086, issued on May 12, was assigned to EMvision Medical Devices Ltd (Brisbane, Australia). "Apparatus and process for medical imaging" was i... और पढ़ें


US Patent Issued to AGC GLASS EUROPE, AGC, AGC FLAT GLASS NORTH AMERICA, AGC VIDROS DO BRASIL on May 12 for "Process of determination of a percentage of glass surface to treat and associated mobile application" (Belgian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,087, issued on May 12, was assigned to AGC GLASS EUROPE (Louvain-la-Neuve, Belgium), AGC INC. (Chiyoda Ku, Japan), AGC FLAT GLASS NORTH AMERI... और पढ़ें


US Patent Issued to QUALCOMM on May 12 for "Prediction of a material profile of a target object based on sensing" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,088, issued on May 12, was assigned to QUALCOMM Inc. (San Diego). "Prediction of a material profile of a target object based on sensing" was... और पढ़ें